13 December, 2025
oxford-scientists-unveil-new-optical-model-for-complex-materials

Scientists at the University of Oxford have unveiled a groundbreaking approach to understanding how materials interact with polarized light, a development that could significantly enhance biomedical imaging and material design. Their research, published in Advanced Photonics Nexus, focuses on refining the analysis of a critical optical property known as the retarder.

In the field of optics, a retarder is a material or device that alters the orientation of light waves as they pass through. Light waves possess an orientation called polarization, and a retarder shifts the phase between different components of that light, effectively delaying one part of the wave compared to another. This property is crucial in technologies such as LCD screens, microscopes, and imaging systems, as it can reveal hidden details about a material’s structure.

For decades, researchers have relied on Mueller matrix polarimetry, a technique that uses a 16-element matrix to describe how a sample changes light’s polarization. A key component of this matrix is the retarder element. Traditionally, scientists assume that a retarder’s behavior can be simplified into two types: a linear retarder, which delays light along one axis, and a circular retarder, which rotates the direction of linear polarization. However, real materials often have complex or unknown internal structures, making this assumption unreliable.

Introducing the Elliptical Retarder Model

To address these limitations, Runchen Zhang and colleagues, under the leadership of Professor Chao He at the University of Oxford, proposed a more comprehensive approach by adopting the elliptical retarder model. This model describes a retarder using three parameters: elliptical axis orientation, degree of ellipticity, and elliptical retardance. Unlike traditional models, this method does not require prior knowledge of the material’s structure and captures the full properties of the retarder.

The elliptical model, initially proposed by Lu and Chipman but less commonly utilized, was tested on liquid crystal samples. It successfully avoided the misinterpretations often associated with conventional methods, accurately characterizing samples with layered structures and even droplets lacking distinct layers.

Implications for Biomedical Imaging and Material Design

This novel approach simplifies the interpretation of polarization data for retarders with unknown or intricate structures. It holds significant promise for improving biomedical imaging, where bulk tissue often contains multiple layers with varying properties. Additionally, it could enhance the design of structured-light modulation devices, such as cascaded waveplates or spatial light modulators.

The researchers acknowledge that further refinements are needed to address phase ambiguities, but they emphasize that the model provides an alternative perspective for more versatile polarization analysis.

“This approach could revolutionize the way we analyze complex materials, offering new insights and improving the accuracy of imaging technologies,” said Professor Chao He.

Looking Forward

The announcement comes as the scientific community continues to seek innovative methods to better understand material properties and improve technological applications. The elliptical retarder model represents a significant step forward in the field of optics, offering a more nuanced understanding of how light interacts with complex materials.

As researchers continue to refine this model, the potential applications in various fields, from medical imaging to advanced material design, are vast. The study by Zhang and his team opens new avenues for exploration, inviting further research and collaboration to fully realize the benefits of this innovative approach.

For those interested in a deeper dive into the research, the original Gold Open Access article by R. Zhang et al., titled “Elliptical vectorial metrics for physically plausible polarization information analysis,” is available in Advanced Photonics Nexus, Volume 4, Issue 6, Article 066015 (2025), doi: 10.1117/1.APN.4.6.066015.